Photoelectric conversion device and method of making the same

ABSTRACT

A photoelectric conversion device with a substrate having an insulating surface, and a plurality n of semiconductor photoelectric conversion elements U 1  to U n  sequentially formed side by side on the substrate and connected in series one after another, which eliminates leakage between electrodes and attains a high photoelectric conversion efficiency.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to improvement in or relating to a photoelectric conversion device in which a plurality of semiconductor photoelectric conversion elements are sequentially arranged on a substrate in side-by-side relation and are connected in series.

The invention also pertains to a method for the manufacture of such a photoelectric conversion device.

2. Description of the Prior Art

Heretofore there has been proposed a photoelectric conversion device of the type that a plurality n (n being an integer greater than one) of semiconductor photoelectric conversion elements U₁ to U_(n) are sequentially formed side by side on a substrate having an insulating surface and are connected in series one after another.

According to this semiconductor photoelectric conversion device, the semiconductor photoelectric conversion element U_(i) (i=1, 2, . . . n) has a first electrode E_(i) formed on the substrate, a non-single-crystal semiconductor laminate member Q_(i) formed on the first electrode E_(i) and a second electrode F_(i) formed on the non-single-crystal semiconductor laminate member Q_(i). The non-single-crystal semiconductor laminate member Q_(i) has at least a first non-single-crystal semiconductor layer having a P or N conductivity type, a second non-single-crystal semiconductor layer having an I conductivity and a third non-single-crystal semiconductor layer having opposite conductivity type to the first non-single-crystal semiconductor layer. The first electrodes E_(j) (j=1, 2, . . . (n-1)) and E_(j+1) are separated by a first groove G_(j). The non-single-crystal semiconductor laminate member Q_(j+1) extends to the non-single-crystal semiconductor laminate member Q_(j) and down to the substrate in the groove G_(j). The second electrode F_(j+1) extends on the extending portion Q'_(j+1) of the non-single-crystal semiconductor laminate member Q_(j+1) and the non-single-crystal semiconductor laminate member Q_(j). The second electrodes F_(j) and F_(j+1) are separated by an isolating portion H_(j) opposite the first electrode E_(j). The non-single-crystal semiconductor laminate member Q_(j) has a second groove O_(j) extending between the first electrode E_(j) and the second electrode F_(j+1). The second electrode F_(j+1) is coupled with the first electrode E_(j) through a coupling portion K_(j) formed by an extension of the second electrode F_(j+1) and extending into the second groove O_(j).

In such a photoelectric conversion device, leakage is likely to develop between the first electrodes E_(j) and E_(j+1) across the extending portion Q_(j+1) ' and the non-single-crystal semiconductor laminate member Q_(j+1) ' of and between the second electrodes F_(j) and F_(j+1) across the region of the non-single-crystal semiconductor laminate member Q_(j) underlying the isolating portion H_(j).

The leakage between the first electrodes E_(j) and E_(j+1) leads to a short between the first electrode E_(j+1) and the second electrode F_(j+1) across the coupling portion K_(j), and the leakage between the second electrodes F_(j) and F_(j+1) also leads to a short between the first electrode E_(j) and the second electrode F_(j) across the coupling portion K_(j).

It is therefore impossible with the above conventional photoelectric conversion device to obtain a predetermined high voltage corresponding to the number n of photoelectric conversion elements U_(l) to U_(n).

Furthermore, in the abovesaid conventional photoelectric conversion device, since a carrier depletion layer is not formed on the second non-single-crystal semiconductor layer of the laminate member Q_(i) throughout it, all carriers which are created in the I-type second non-single-crystal semiconductor layer by the incidence of light on the laminate member Q_(i) cannot effectively be field-drifted to the P-type and/or N-type layer. Accordingly, the conventional photoelectric conversion device is relatively low in photoelectric conversion efficiency.

SUMMARY OF THE INVENTION

It is therefore an object of the present invention to provide a novel photoelectric conversion device which is free from the abovesaid defects.

Another object of the present invention is to provide a method for the manufacture of the abovesaid photoelectric conversion device.

In accordance with an aspect of the present invention, as is the case with the photoelectric conversion device mentioned above, a plurality n of semiconductor elements U₁ to U_(n) formed on a substrate having an insulating surface, and the semiconductor element U_(i) (i=1, 2, . . . n) has a first electrode E_(i) formed on the substrate, a non-single-crystal semiconductor laminate member Q_(i) formed on the first electrode E_(i) and a second electrode F_(i) formed on the non-single-crystal semiconductor laminate member Q_(i). The non-single-crystal semiconductor laminate member Q_(i) has at least a first non-single-crystal semiconductor layer having a P or N conductivity type, a second non-single-crystal semiconductor layer having an I conductivity and a third non-single-crystal semiconductor layer having opposite conductivity type to the first non-single-crystal semiconductor layer. The first electrode E_(j) (j=1, 2, . . . (n-1)) and E_(j+1) are separated by a first groove G_(j). The non-single-crystal semiconductor laminate member Q_(j+1) extends to the non-single-crystal semiconductor laminate member Q_(j) and down to the substrate in the groove G_(j). The second electrode F_(j+1) extends on the extending portion Q'_(j+1) of the non-single-crystal semiconductor laminate member Q_(j+1) and the non-single-crystal semiconductor laminate member Q_(j). The second electrodes F_(j) and F_(j+1) are separated by an isolating portion H_(j) opposite the first electrode E_(j). The non-single-crystal semiconductor laminate member Q_(j) has a second groove O_(j) extending between the first electrode E_(j) and the second electrode F_(j+1). The second electrode F_(j+1) is coupled with the first electrode E_(j) through a coupling portion K_(j) formed extension of the second electrode F_(j+1) and extending by an into the second groove O_(j).

According to the present invention, however, at least the second non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(j) has a region between the first electrode E_(j) and the second electrode F_(j), where the first region having a conductivity higher than the second non-single-crystal semiconductor layer of the extending portion Q'_(j) of the non-single-crystal semconductor laminate member Q_(j) and the region of the second non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(j) underlying the isolating portion H_(j).

According to the photoelectric conversion device of the present invention, the region of the second non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(j) has a higher conductivity than at least the second non-single-crystal semiconductor layer of the extending portion Q_(j) ' of the non-single-crystal semiconductor laminate member Q_(j) and the region of the second non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(j) underlying the isolating portion H_(j). This means that the extending portion Q_(j) ' of the non-single-crystal semiconductor laminate member Q_(j) and the region of the second non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(j) underlying the isolating portion H_(j) have a high resistance. On account of this, no leakage occurs between the first electrodes E_(i) and E_(j+1) across the extending portion Q_(j+1) ' and between the second electrodes F_(j) and F_(j+1) across the region of the non-single-crystal semiconductor laminate member Q_(j) underlying the isolating portion H_(j), and even if leakage develops, it is negligibly small. Accordingly, there are substantially no possibilities of causing a short between the first and second electrode E_(j+1) and F_(j+1) across the coupling portion K_(j) and between the first and second electrodes E_(j) and F_(j) across the coupling portion K_(j).

Furthermore, according to the photoelectric conversion device of the present invention, since the region of the second non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(j) has a high conductivity, a carrier depletion layer can be formed throughout the I-type second semiconductor layer of the laminate member Q_(i). This permits effective utilization of all carriers which are created in the I-type layer by the incidence of light on the laminate member Q_(i).

Accordingly, with the photoelectric conversion device of the present invention, it is possible to obtain a larger photo current than is obtainable with the prior art photoelectric conversion devices, and the photoelectric conversion device of the present invention is relatively high in photoelectric conversion efficiency.

According to the manufacturing method of the present invention, the above-mentioned photoelectric conversion device of the present invention is fabricated through the following sequential steps.

The manufacture starts with the formation of a first conductive layer on the abovesaid substrate. The first conductive layer will ultimately form the first electrodes E₁ to E_(n).

Next, the first conductive layer is exposed to a laser beam to cut therein (n-1) first grooves G_(l) to G_(n-1) which are sequentially arranged, providing the first electrodes E₁ to E_(n) individually separated by the first grooves G₁ to G_(n1).

Next, a non-single-crystal semiconductor laminate member, which will ultimately form the non-single-crystal semiconductor laminate members Q₁ to Q_(n), is formed on the substrate filling the first grooves G₁ to G_(n-1) and covering the first electrodes E₁ to E_(n).

Next, the non-single-crystal semiconductor laminate member is exposed to a laser beam to cut therein (n-1) sequentially arranged second grooves G₁ to G_(n-1). As a result of this, the non-single-crystal semiconductor laminate member Q₁ to Q_(n) are formed which extend on the first electrodes E₁ to E_(n), respectively, and the first electrodes E₁ to E_(n-1) are exposed to the outside through the grooves O₁ to O_(n-1), respectively, where the semiconductor laminate member Q_(j+1) extends to the non-single-crystal semiconductor laminate member O_(j) and down to the substrate 1 in the second groove G_(j).

Next, a second conductive layer which will utimately form the second electrode F₁ to F_(n), is formed which continuously extends on the non-single-crystal semiconductor laminate members Q₁ to Q_(n) and into the second grooves O₁ to O_(n-1), providing coupling portions K₁ to K_(n-) which are connected to the first electrodes E₁ to E_(n-1) through the second grooves O₁ to O_(n-1), respectively.

Next, (n-1) sequentially arranged isolating portions H₁ to H_(n-1) are formed in at least the second conductive layer, providing n sequentially arranged second electrodes F₁ to F_(n) which are separated by the isolating portions H₁ to H_(n-1) and are opposite therethrough the first electrodes E₁ to E_(n-1), respectively. The second electrode F_(j+1) is connected to the first electrode E_(j) through the coupling portion K_(j).

Before or after the above step, that a portion of the second non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(i) which is sandwiched between the first electrode E_(i) and the second electrode F_(i) is subjected to annealing by light having a wavelength greater than 500 nm so as to increase the conductivity of that portion.

In this way, the photoelectric conversion device of the present invention is manufactured.

Such a manufacturing method of the present invention permits easy fabrication of the photoelectric conversion device of the present invention which possesses the aforementioned excellent features.

Other objects, features and advantages of the present invention will become more fully apparent from the following detailed description taken in conjunction with the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a plan view schematically illustrating the photoelectric conversion device of an embodiment of the present invention;

FIG. 2 is a schematic sectional view taken on the line II--II in FIG. 1;

FIG. 3 is detailed cross-sectional views showing on an enlarged scale parts of the embodiment of the present invention shown in FIG. 2.

FIGS. 4A to 4H are cross-sectional views schematically showing a sequence steps involved in the manufacture of the photoelectric conversion device of the embodiment of the present invention depicted in FIGS. 1 to 3.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

A description will be given first, with reference to FIGS. 1 to 3, of a photoelectric conversion device of an embodiment of the present invention.

The embodiment of the photoelectric conversion device of the present invention shown in FIGS. 1 to 3 has a plurality n (n being an integer larger than one) of photoelectric conversion elements U₁ to U_(n) formed side by side on a substrate 1.

The substrate 1 has an insulating surface 2 shown in FIG. 4A

The substrate 1 may be a light-transparent substrate made of glass, organic synthetic resin or the like, or a flexible sheet as of organic synthetic resin. It is also possible to employ a non-light-transparent substrate of ceramics, organic resin or the like, a non-light-transparent metal substrate having its surface insulated, or a flexible, insulating sheet-like member having an insulating film, for example, a 5 μm thick polyimide regin film, formed on the surface of a flexible metallic sheet, for example, a stainless steel foil about 100 μm thick.

The substrate 1 is, for example, rectangular in shape and 10 cm wide and 10 cm long.

The photoelectric conversion element U_(i) (i=1, 2, 3, . . . n) on the substrate 1 has an electrode E_(i) formed on the substrate 1, a non-single-crystal semiconductor laminate member Q_(i) formed on the electrode E_(i) and an electrode F_(i) formed on the non-single-crystal semiconductor laminate member Q_(i) in opposing relation to the electrode E_(i).

The electrode E_(i) is, for example, rectangular in shape and has a thickness of 0.1 to 0.5 μm.

Electrodes E_(j) (j=1, 2, . . . (n-1)) and E_(j+1) are separated by a groove G_(j). The groove G_(j) is, for example, 40 μm wide.

The electrode E_(i) may be a single-layer structure, or a two-layer structure which comprises a layer making contact with the substrate 1 and a layer formed on the layer in contact with the non-single-crystal semiconductor laminate member Q_(i).

The electrode E_(i) may be a reflective electrode when the electrode F_(i) is light-transparent. When the electrode E_(i) is the reflective electrode, light incident on the non-single-crystal semiconductor laminate member Q_(i) on the opposite side from the substrate 1 passes through the non-single-crystal semiconductor laminate member Q_(i), then is reflected by the surface of the electrode E_(i) back to the non-single-crystal semiconductor laminate member Q_(i) to pass therethrough. The larger the optical path length of the reflected light in the non-single-crystal semiconductor laminate member Q_(i) is, the more the utilization efficiency of light is raised. From this point of view, it is preferable that the surface of the electrode E_(i) on the side of the non-single-crystal semiconductor laminate member Q_(i) have irregularities oblique to planes perpendicular to the substrate surface to form a diffuse reflection surface at the boundary between it and the non-single-crystal semiconductor laminate member Q_(i).

In the case where the electrode E_(i) is reflective and has the single-layer structure, it may be a reflective conductive layer. In this case, the layer may be one that is formed of aluminum or silicon, or consisting principally thereof.

In the case where the electrode E_(i) is a reflective electrode and has the two-layer structure, in order to simultaneously satisfy the requirements that the electrode E_(i) be of high conductivity and high reflectivity and to prevent that when the non-single-crystal semiconductor laminate member Q_(i) is formed, the material of its non-single-crystal semiconductor layer on the side of the electrode E_(i) or an impurity contained therein reacts with the material of the reflective electrode to form a layer of high contact resistance in the interface between the electrode E_(i) and the non-single-crystal semiconductor laminate member Q_(i), it is preferable that the layer making contact with the substrate 1 be a reflective conductive layer and that the layer making contact with the non-single-crystal semiconductor layer Q_(i) be a light transparent metal oxide layer. In the case where the layer making contact with substrate 1 is the reflective conductive layer, it may preferably be made of metal. The metal may be stainless steel but, in view of the requirements of high conductivity and high reflectivity for the electrode E_(i), it is preferable to employ aluminum (Al), silver (Ag), an aluminum-base alloy containing, for example, 0.1 to 2 volume % of silicon, or a silver-base alloy. When the layer making contact to the non-single-crystal semiconductor laminate member Q_(i) is a light-transparent metal oxide layer, in order to ensure that the layer be high in conductivity and in transmittance and to prevent that when the non-single-crystal semiconductor laminate member Q_(i) is formed, the metallic oxide reacts with the material or impurity of the non-single-crystal semiconductor layer of the laminate member Q_(i) on the side of the electrode E_(i) to form the abovesaid high contact resistance layer, it is preferable to form the layer making contact with the non-single-crystal semiconductor laminate member Q_(i) of a tin oxide (SnO₂ or SnO) or a metallic oxide consisting principally of such a tin oxide, for instance, a tin oxide containing halogen or, 1 to 10 wt % of antimony oxide in the event that the non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(i) on the side of the electrode E_(i) is p-type. In the case where the layer of the non-single-crystal semiconductor laminate member Q_(i) on the side of the electrode E_(i) is N-type, it is preferable to use an indium oxide or a metallic oxide consisting principally of thereof, for instance, an indium oxide containing 1 to 10 wt % of tin oxide. In this case, the light transparent conductive layer is 300 to 600 Å thick.

In the case where the electrode E_(i) is such a two-layer reflective electrode, when the abovesaid diffuse reflection surface is formed at the boundary between the electrode E_(i) and the non-single-crystal semiconductor laminate member Q_(i), it is formed on the surface of the layer making contact with the non-single-crystal semiconductor laminate member Q_(i) on the side of the laminate member Q_(i).

In the case where the electrode E_(i) is comprised of two layers, these layers are a reflective conductive layer and a light-transparent conductive layer to form a reflective electrode, the surface of the reflective layer may also be formed as the diffuse reflection surface in the interface between it and the light-transparent conductive layer.

When the substrate 1 is light-transparent, the electrode E_(i) is formed as a light-transparent electrode. In such a case, the light-transparent electrode may be a metal oxide layer.

Where the electrode E_(i) is a light-transparent sinle layer ectrode, when the non-single-crystal semiconductor layer of the non-single-crystal laminate member Q_(i) on the side of the electrode E_(i) is P-type, the electrode E_(i) may preferably of a tin oxide or a metallic oxide consisting principally thereof for the same reasons as given previously. When the abovesaid non-single-crystal semiconductor layer is N-type, the electrode E_(i) may preferably be a metal oxide layer formed of an indium oxide or consisting principally thereof.

In the case where the electrode E_(i) has the two-layer structure and is light-transparent, if the non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(i) on the side of the electrode E_(i) is P-type, it is preferable that the layer making contact with the non-single-crystal semiconductor laminate member Q_(i) be a metal oxide layer formed of a tin oxide or a metalic oxide consisting principally thereof and that the layer making contact with the substrate 1 be a metal oxide layer formed of an indium oxide or a material oxide consisting principally thereof.

When the electrode F_(i) is light-transparent, the electrode E_(i) need not always be reflective. In this case, if the electrode E_(i) is single-layer, it may be a layer formed of chrominum or a material consisting principally thereof. Moreover, in the case of the two-layer structure, the layer making contact with the substrate 1 may be the abovesaid metal oxide layer and the layer making contact with the non-single-crystal semiconductor laminate member Q_(i) may be a layer formed of chrominum or a material consisting principally thereof.

In the photoelectric conversion element U_(i) formed on the substrate 1, the non-single-crystal semiconductor laminate member Q_(j+1) (j=1, 2, . . . (n-1)) on the aforesaid electrode E_(j+1) extends laterally to the non-single-crystal semiconductor laminate member Q_(j) and down to the substrate 1 in the groove G_(j) separating the electrode E_(j) and E_(j+1).

As shown in FIGS. 1 to 3, an electrode E_(a) similar to the electrodes E₁ to E_(n) is formed on the substrate 1 on the side of the electrode E₁ of the element U₁ on the opposite side from the electrode E₁ and the electrode E_(a) is separated by a groove G₀ similar to those G₁ to G_(n-1).

Further, the non-single-crystal semiconductor laminate member Q₁ of the element U₁ extends laterally to the marginal edge of the electrode E_(a) on the opposite side from the electrode E₁ and down to the substrate 1 in the groove G₀.

Moreover, as shown in FIGS. 1 to 3, an electrode E_(b) similar to the electrode E₁ to E_(n) is formed on the substrate 1 on the side of the electrode E_(n) of the element U_(n) on the opposite side from the electrode E_(n-1) and the electrode E_(b) is separated by a groove G_(n) similar to those G₁ to G_(n-1).

Further, laminate member Q_(n) laterally extend to the marginal edge of the electrode E_(b) on the opposite side from the electrode E_(n) and down to the substrate 1 in the groove G_(n).

The non-single-crystal semiconductor laminate member Q_(i) is formed to vertically extend to cover the electrode E_(i). The non-single-crystal semiconductor laminate member Q_(i) has cut therein a groove O_(i) which is shown to extend in the vertical direction in FIG. 1. The grooves O₁ to O_(n) are formed simultaneously.

The non-single-crystal semiconductor laminate semiconductor laminate member Q_(i) may preferably be formed by one or more three-layer structures, each composed of a P-type or N-type non-single-crystal semiconductor layer 8, an I-type non-single-crystal semiconductor layer 9 and a non-single-crystal semiconductor layer 10 opposite in conductivity type to the layer 8 as shown in FIG. 3. Accordingly, the non-single-crystal semiconductor laminate member Q_(i) may preferably be formed to have at least one PIN junction.

The non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(i) on the side of the electrode E_(i) is P-type when the layer of the electrode E_(i) making contact with the non-single-crystal semiconductor laminate member Q_(i) is formed by tin oxide or metallic oxide consisting principally thereof as described previously. When the layer of the electrode E_(i) making contact with the non-single-crystal semiconductor laminate member Q_(i) is formed by an indium oxide or metallic oxide consisting principally thereof, the non-single-crystal semiconductor layers 8 of the non-single-crystal semiconductor laminate member Q_(i) on the side of the electrode E_(i) is N-type.

Accordingly, in the case where the non-single-crystal semiconductor laminate member Q_(i) has the three-layer structure comprising the non-single-crystal semiconductor layers 8, 9 and 10 as illustrated in FIG. 3 and the layer of the electrode E_(i) making contact with the semiconductor laminate member Q_(i) is transparent and is formed by the tin oxide or metallic oxide consisting principally thereof, the non-single-crystal semiconductor layers 8 and 10 are P-type and N-type, respectively. When the layer making contact with semiconductor laminate member Q_(i) is transparent and is formed by the indium oxide or metal oxide consisting principally thereof, the non-single-crystal semiconductor layers 8 and 10 are N-type and P-type, respectively.

The non-single-crystal semiconductor layers making up the non-single-crystal semiconductor laminate member Q_(i) may preferably be formed of silicon or a semiconductor consisting principally thereof silicon but it may also be formed of other semiconductor.

When the non-single-crystal semiconductor laminate member Q_(i) has the three-layer structure composed of the non-single-crystal semiconductor layers 8, 9 and 10, the non-single-crystal semiconductor layer 8 may be formed, for instance, of silicon to a thickness of 5 to 300 Å, preferably 70 to 130 Å. But in this case, the non-single-crystal semiconductor layer 8 is disposed on the side where the light to be converted is incident on the photoelectric conversion element U_(i), it may preferably be formed of a semiconductor which has a larger energy band gap than does the semiconductor material of the non-single-crystal semiconductor layer 10, such as, for example, silicon carbide expressed by Si_(x) C_(1-x) (0<x<1). where the non-single-crystal semiconductor layer 8 is P-type, for example, boron (B) may be introduced thereinto as a P-type impurity.

The non-single-crystal semiconductor layer 9 can be formed of silicon as is the case with the non-single-crystal semiconductor layer 8 but its thickness may preferably be larger than that of the layer 8, for instance, 0.3 to 3.0 μm. The non-single-crystal semiconductor layer 9 contains a very small amount of a P-type impurity or does not substantially contain either of P-type and N-type impurities and, if any, their concentrations are negligibly low.

The non-single-crystal semiconductor layer 10 can also be formed of silicon as is the case with the non-single-crystal semiconductor layer 8. In case, however, the non-single-crystal semiconductor layer 10 is disposed on the side where the light to be converted is incident on the photoelectric conversion element, it may preferably be formed of a semiconductor which has a larger energy band gap than does the semiconductor material of the non-single-crystal semiconductor layer 8, such as, for example, silicon carbide expressed by Si_(x) C_(1-x) (0<x<1). In this case, the non-single-crystal semiconductor layer 10 can be formed to a thickness of 5 to 300 Å, typically, in the range of 7 to 130 Å.

In the semiconductor element U_(i) formed on the substrate 1, the electrode F_(i) on the non-single-crystal semiconductor laminate member Q_(i) is disposed opposite to the electrode E_(i) formed on the non-single-crystal semiconductor laminate member Q_(i).

In this case, the electrode F_(j+1) extends on the extending portion Q_(j+1) ' of the non-single-crystal semiconductor laminate member Q_(j+1) and the non-single-crystal semiconductor laminate member Q_(j).

The electrode F₁ extends on the non-single-crystal laminate member Q₁ to the marginal edge of the non-single-crystal laminate member Q₁ on the side opposite from the non-single-crystal semiconductor laminate member Q₂.

On the non-single-crystal semiconductor laminate member Q_(n), an electrode F₀ similar to the electrode F_(n) is formed on the non-single-crystal semiconductor laminate member Q₀ to the marginal edge of the non-single-crystal semiconductor laminate member Q₀ opposite from the non-single-crystal semiconductor laminate member Q_(n-1).

The electrodes F_(j) and F_(j+1) are isolated by an isolating portion H_(j). The electrodes F_(j+1) and F₀ are also isolated by an isolating portion H_(n). The isolating portions H_(i) and H_(n) may be simultaneously formed as grooves as is the case with the grooves G_(i).

The electrode F_(i) may be formed as a single layer and may also be of the two-layer structure comprised of a layer making contact with the non-single-crystal semiconductor laminate member Q_(i) and a layer formed on the layer.

The electrode F_(i) may be a transparent conductive layer. When the electrode F_(i) is a transparent single layer, it may be formed of a metallic oxide. In this case, it is required that the metal oxide be high in conductivity and in transmittance and, when forming the electrode F_(i), would not react with the material or impurity of the non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(i) on the side of the electrode F_(i) to form a layer which increases the contact resistance between the non-single-crystal semiconductor laminate member Q_(i) and the electrode F_(i) or a layer of low transmittance. To meet such requirements, when the non-single-crystal layer of the non-single-crystal semiconductor laminate member Q_(i) on the side of the electrode F_(i) is N-type, the electrode F_(i) may preferably be formed of an indium oxide or metallic oxide consisting principally thereof, such as, for example, an indium oxide containing 1 to 10 wt % of tin oxide. When the non-single-crystal layer of the non-single-crystal semiconductor to laminate layer Q₁ on the side of the electrode F_(i) is P-type, the electrode F_(i) may preferably be formed of a tin oxide or metallic oxide consisting principally thereof. The electrode F_(i) can be formed, for instance, 300 to 600 Å thick.

In the case where the electrode E_(i) is transparent and has the two-layer structure, the layer making contact with the non-single-crystal semiconductor laminate member Q_(i) may preferably be a layer formed of the tin oxide or consisting principally thereof, or a layer formed of the indium oxide or consisting principally thereof as described previously depending on whether the non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(i) is P-type or N-type. In this case, it is preferable that when the layer making contact with the non-single-crystal semiconductor laminate member Q_(i) is formed of the tin oxide or consisting principally thereof, the other layer is formed of the indium oxide or consisting principally thereof and, when the former layer is the layer formed of the indium oxide or consisting principally thereof, the latter layer be the layer formed of the tin oxide or consisting principally thereof.

The electrode F_(i) may be a reflective one when the substrate 1 and the electrode E_(i) are light-transparent. When the electrode F_(i) is the reflective electrode, it is possible to employ the two-layer structure.

Where the electrode F_(i) has the two-layer structure, it is preferred that depending on whether the non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(i) on the side of the electrode F_(i) is P-type or N-type, the layer making contact with the non-single-crystal semiconductor laminate member Q_(i) is formed of tin oxide or consisting principally thereof, or indium oxide or consisting principally thereof, and the other layer be a reflective conductive layer as of silver or aluminum, as described previously.

The electrode F_(i) need not always be reflective even if the substrate 1 and the electrode E_(i) are light-transparent. In such a case, if the electrode has the two-layer structure, it is preferred that the layer making contact with the non-single-crystal semiconductor laminate member Q_(i) is formed of the tin or indium oxide as mentioned above and the other layer is formed of a sublimable conductive layer formed of chrominum or consisting principally thereof.

The electrode F₀ to extending on the non-single-crystal semiconductor laminate member Q_(n) has the same structure as the abovesaid electrode F_(i).

The electrode F_(j+1) of the semiconductor element U_(j+1) (j=1, 2, . . . (n-1)) is coupled with the electrode E_(j) of the semiconductor element U_(j) through a coupling portion K_(j).

The coupling portion K_(j) extends from the position where the electrode F_(j+1) is opposite to the electrode E_(j) to the region of the electrode E_(j) opposite to the electrode F_(j+1), passing through a groove O_(j). Such a coupling portion K_(j) is formed by an extension of the electrode F_(j+1) formed simultaneously with the electrode F_(j+1).

The electrode F₁ of the semiconductor element U₁ constitutes an external connection terminal 11.

The electrode F₀ extending on the non-single-crystal semiconductor laminate member Q_(n) is coupled with the electrode E_(n) of the semiconductor element U_(n) through a coupling portion K_(n). In this case, the coupling portion K_(n) extends from the position where the electrode F₀ is opposite to the electrode E_(n) to the region of the electrode E_(n) opposite to the electrode F₀, passing through a groove O_(n). Such a coupling portion K_(n) is an extension of the electrode F₀ formed simultaneously therewith. The electrode F₀ extends on the non-single-crystal semiconductor laminate member Q_(n) in the direction reverse from the electrode F_(n) to the marginal edge of the member Q_(n) and the extending end portion forms a terminal 12 for external connection.

The isolated portion H_(i) is formed to extend in the vertical direction in FIG. 1 to the non-single-crystal semiconductor laminate member Q_(j).

The isolated portion H_(i) may be is formed to extend into the non-single-crystal semiconductor laminate member Q₁.

On the substrate 1 is formed a transparent antireflection and protective film 15 to cover the aforesaid semiconductors U₁ to U_(n). In this case, however, the antireflection and protective film 15 does not extend on the extended portions of the electrodes F₁ and F₀ forming the aforementioned external connection terminals 11 and 12, respectively.

In the photoelectric conversion element U_(i) formed on the substrate 1, the non-single-crystal semiconductor laminate member Q_(i) has formed therein an active portion indicated by double hatching and reference numeral 20 in the region sandwiched between the first and second electrodes E_(i) and F_(i). the portion 14 has a higher conductivity than does the other portion identified by 21, and is formed of a microcrystalline or polycrystalline semiconductor when the part 15 is formed of a semi-amorphous semiconductor. Moreover, when the part 15 is formed of a microcrystalline or polycrystalline semiconductor, the portion 14 is formed of a microcrystalline or polycrystalline semiconductor of a larger grain size.

While it has been described above that the portion 20 of the laminate member Q_(j), and consequently, the portion of the layers 8, 9 and 10 of the laminate member Q_(j) in the region between the electrodes E_(i) and F_(i) have a higher conductivity than the other portions, only the portion of the I-type layer 9 in the region between the electrodes E_(i) and F_(i) may be formed to have a higher conductivity than the other regions and the P- and N-type layers 8 and 10. The foregoing is a description of the arrangement of an embodiment of the photoelectric conversion device according to the present invention.

Next, a description will be given, with reference to FIGS. 4A to 4H, of an embodiment of the photoelectric conversion device manufacturing method of the present invention.

In FIGS. 4A to 4G, parts corresponding to those in FIGS. 1 to 3 are identified by the same reference numerals and characters and no detailed description thereof will be repeated.

The manufacturing method of the photoelectric conversion device shown in FIGS. 4A to 4H is as follows:

The manufacture starts with the preparation of such a substrate 1 as described previously in respect of FIGS. 1 to 3, as shown in FIG. 4A.

Then, as shown in FIG. 4B, the conductive layer 41 which will ultimately form the electrodes E_(a), E₁ to E_(n) and E_(b) described previously in connection with FIGS. 1 and 2 is formed by a known method on the substrate 1.

In the case where the electrodes E_(a), E₁ to E_(n) and E_(b) are each formed to have the two-layer structure composed of the two layers and as described previously, the conductive layer 41 is made up of a layer which will ultimately serve as the layer and another layer which ultimately serve as the layer, though neither shown nor described in detail. The former layer is first formed on the substrate 1 by a known method, for example, vapor deposition and then the latter layer is similarly formed thereon by a known method, for instance, vapor deposition.

Next, the conductive layer 41 is irradiated by a laser beam (not shown) having a diameter of 30 to 70 μm, typically, 40 μm, by which the aforementioned (n-1) grooves G₀ and G₁ to G_(n-1) are cut in the conductive layer 41 to form n electrodes E_(a), E₁ to E_(n) and E_(b) which are separated from adjacent ones of them by the grooves G₁ to G_(n), as shown in FIG. 4C. For irradiation of laser beam, it is possible to employ a laser beam of a 1.06 μm wavelength from a YAG laser and a laser beam of a 0.488 or 0.512 μm wavelength from an argon laser.

The abovesaid irradiation of the laser beam can be carried out in the air but may also be performed in the atmosphere of a gas which reacts with the conductive material of the layer 41 at high temperatures to spatter it from the substrate surface. In this case, the gas used may be hydrogen fluride (HF), hydrogen chloride (HCl) or Freon gas (CF₄, CHF₃, CClF₃ and like gases).

In the case where the irradiation of the laser beam scanning takes place in the air, burrs are likely to form on the upper marginal edges of the grooves G₀ and G₁ to G_(n). Accordingly, it is desirable that the irradiation of the laser beam be followed by deburring through the use of the abovesaid gas or etching with an etchant such as fluoric acid (HF), hydrochloric acid (HCl) or Freon liquids C₂ F₃ Cl₄ and similar liquids.

Moreover, it is possible to accomplish the irradiation of the laser beam of the conductive layer 41 easily and accurately by the aid of a computer while monitoring through a video camera device.

Next, a non-single-crystal semiconductor layer 42 is formed by a known method, for example, low-pressure CVD on the substrate 1 to fill the grooves G₀ and G₁ to G_(n) and to cover the electrode E_(n), E₁ to E_(n) and E_(b) as shown in FIG. 4D so that the regions of the layer 42 on the electrodes E₁ to E_(n) may be the non-single-crystal semiconductor laminate members Q₁ to Q_(n) described previously in respect of FIGS. 1 to 3.

Where the non-single-crystal semiconductor laminate members Q₁ to Q_(n) are each formed as the three-layer structure consisting of the non-single-crystal semiconductor layers 8, 9 and 10 as described previously with regard to FIG. 3, non-single-crystal semiconductor layers which will ultimately be used as the non-single-crystal layers 8, 9 and 10 respectively, are formed in this order through the use of a known method, for instance, the low-pressure CVD method, thereby providing the non-single-crystal semiconductor laminate member 42.

After this, the non-single-crystal semiconductor laminate members Q₁ to Q_(n) are selectively removed by using a laser beam to cut therein the aforementioned n grooves O₁ to O_(n) as shown in FIG. 4E.

In this case, the groove O_(i) (i=1, 2, . . . n) can be formed to extend down to the insulating film of the substrate 1 across the electrode E_(i) as illustrated. The irradiation of the laser beam of the non-single-crystal semiconductor laminate members Q₁ to Q_(n) can take place in the air as is the case with the conductive layer 41. It is also possible to carry out the irradiation of the laser beam scanning in the atmosphere of a gas which reacts with the materials of the non-single-crystal semiconductor laminate member 42 and the electrodes E_(a), E₁ to E_(n) and E_(b) at high temperatures to spatter them from the substrate suface 1. Also in this case, the gas used is hydrogen fluoride, hydrogen chloride or Freon gas.

In the case where the irradiation of the laser beam of the non-single-crystal semiconductor laminate members Q₁ to Q_(n) is carried out in the air, it is desirable that the irradiation of the laser beam be followed by deburring through the use of the aforesaid gas or etching with such etchants as mentioned previously.

The abovesaid irradiation of the laser beam can also be performed easily and accurately by the aid of a computer while monitoring through the video camera device.

The groove O_(j) (j=1, 2, . . . (n-1)) is formed at a position spaced a predetermined distance apart from the groove G_(j) laterally thereof (on the left thereof in FIG. 4). The abovesaid predetermined distance is large as compared with the thickness of the non-single-crystal semiconductor laminate member 42. It is preferable, however, to minimize this distance. By the aid of a computer the groove O_(j) can be provided in close proximity to the groove G_(j) with high accuracy. This permits reduction of the area of the substrate 1 occupied by the region 14 of the electrode E_(j).

Next, as shown in FIG. 4F, a conductive layer 43, which will ultimately form the electrodes F₁ to F_(n) and F₀ referred to in respect to FIGS. 1 to 3, is formed, for example, vapor deposition on the substrate 1 to cover the non-single-crystal semiconductor laminate members Q₁ to Q_(n) and to fill the grooves O₁ to O_(n), forming coupling portions K₁ to K_(n).

Next, as shown in FIG. 4H, the conductive layer 43 is selectively removed by using laser beam as is the case with the conductive layer 41. By this irradiation of the laser beam there are formed in the conductive layer 43 n isolating portions H₁ to H_(n), electrodes F₁ to F_(n) and F₀ isolated by the isolating portions H₁ to H_(n), respectively, and opposite to the electrodes E₁ to E_(n) across the non-single-crystal semiconductor laminate members Q₁ to Q_(n), respectively. In this case, the irradiation of the laser beam is carried out so that the electrode F_(j+1) may be linked with the electrode E_(j) through the coupling portion K_(j) and so that the electrode F₀ may be linked with the electrode E_(n) through the coupling portion K_(n).

By the abovesaid irradiation of the laser beam the isolating portion H_(i) (i=1, 2, . . . n) can be formed to extend into the non-single-crystal semiconductor laminate member Q_(i).

As is the case with the conductive layer 41, the irradiation of the laser beam scanning of the conductive layer 43 can be effected in the air and may also be carried out in the atmosphere of a gas which reacts with the materials of the conductive layer 43 and the non-single-crystal semiconductor laminate members Q₁ to Q_(n) at high temperatures to spatter them from the substrate surface. The gas used in this case may be hydrogen fluoride, hydrogen chloride or Freon gas.

Also in the case of performing the irradiation of the laser beam of the conductive layer 43 in the air, it is desirable that the irradiation of the laser beam be followed by deburring through the use of the aforesaid gas or etching using the aforesaid liquid as the etchant.

By the irradiation of the laser beam for the conductive layer 43, the isolating portion H_(i) can be provided in the form of a groove as illustrated.

The irradiation of the laser beam of the conductive layer 43 can also be carried out easily and accurately by the aid of a computer while monitoring through the video camera device.

Further, the isolating portion H_(i) is formed a predetermined distance apart from the groove O_(i) laterally thereof (on the left thereof in the drawing). The abovesaid predetermined distance is large as compared with the thickness of the non-single-crystal semiconductor laminate member 43, but it may preferably be selected as small as possible. By the aid of a computer the isolating portion H_(i) can be formed in close proximity to the groove O_(i) with high precision.

Before or after the formation of the isolating portion H_(j), the portion 20 described previously in connection with FIGS. 1 to 3 is formed in the laminate member Q_(j). In FIG. 4, the portion 20 is shown to be formed before the formation of the isolating portion H_(j). Where the substrate 1 and the first electrode E_(i) are transparent, the portion 20 is formed by irradiating the laminate member Q_(j) locally with light of a wavelength greater than 500 nm from the side of the substrate 1. The irradiation by light takes place through the conductive layer 43 when it is transparent. For this irradiation, a continuous YAG lser beam (500 nm in wavelength) and an intermittent YAG laser beam can be employed.

Where the laminate member Q_(i) is formed of an amorphous semiconductor before the light irradiation, the amorphous semiconductor of the portion 20 is rendered by the light irradiation into microcrystalline or polycrystalline form. Accordingly, the portion 20 is formed of a microcrystalline or polycrystalline semiconductor, and the portion 21 is formed of an amorphous semiconductor. In the evedent that the laminate member Q_(i) is microcrystalline or polycrystalline before the light irradiation, the portion 20 is formed of a microcrystalline or polycrystalline semiconductor larger in grain size than the portion 21.

After the formation of the portion 20, a transparent antireflection and protection film 15 is formed by a known method on the substrate to cover the electrodes F₁ to F_(n) and F₀ and the isolating portion H₁ to H_(n) as shown in FIG. 2.

In the manner described above, the photoelectric conversion device of the present invention, shown in FIGS. 1 and 2, is manufactured.

The above is a description of an embodiment of the present invention and an example of its manufacturing method.

According to the photoelectric conversion device of FIGS. 1 and 2, when light (not shown) is incident thereon from the side of the substrate 1 or the electrodes F₁ to F_(n) each semiconductor elements U_(i) (i=1, 2, . . . n) carries out photoelectric conversion to generate photovoltage across its electrodes E_(i) and F_(i).

The electrode F_(j+1) (j=1, 2, . . . (n-1)) of the semiconductor element U_(j+1) is linked with the electrode E_(j) of the semiconductor element U_(j) through the coupling portion K_(j) and the electrode F₁ of the semiconductor element U₁ is connected to an external connection terminal 11 and the electrode E_(n) of the semiconductor element U_(n) is connected to an external connection terminal 12 through the coupling portion K_(n) and the electrode F₀.

Accordingly, the semiconductor elements U₁ to U_(n) are sequentially connected in series through the coupling portions K₁ to K_(n-1) and connected to the external connection terminals 11 and 12. Consequently, upon incidence of light, there is developed across the external connection terminals 11 and 12 the photovoltage that is equal to the sum of voltage produced by the semiconductor elements U₁ to U_(n).

A description will be given of other embodiments of the photoelectric conversion device of the present invention.

In the embodiment of the photoelectric conversion device of the present invention depicted in FIGS. 1 to 3, the groove O_(j) extends across the electrode E_(j) to reach the substrate 1, and the coupling portion K_(j) makes contact only with the side of the electrode E_(j) exposed to the groove O_(j).

In other embodiment of the photoelectric conversion device of the present invention, however, the groove O_(j) is not extended into the electrode E_(j) and the coupling portion K_(j) is formed to make contact only with the top of the electrode E_(j) exposed to the groove O_(j).

Further, according to another embodiment, the width of the groove O_(j) in the electrode E_(j) is made smaller than in the non-single-crystal semiconductor laminate member Q_(j) and the coupling portion K_(j) is formed to make contact with the top and side of the electrode E_(j) exposed to the groove O_(j).

Moreover, according to another embodiment, the groove O_(j) is extended into the substrate 1 with a greater width than in the electrode E_(j), and the coupling portion K_(j) is formed to make contact with the side and bottom of the electrode E_(j) exposed to the groove O_(j).

According to another embodiment, the groove O_(j) is extended across the electrode E_(j) and into the substrate 1, and the coupling portion K_(j) is formed to make contact with the top, side and bottom of the electrode E_(j) exposed to the groove O_(j).

In the embodiment of the photoelectric conversion device shown in FIGS. 1 to 3, the electrodes F_(j) and F_(j+1) of the semiconductor elements U_(j) and U_(j+1) are isolated by the isolating portion provided in the form of a groove and the isolating portion H_(j) does not extend into the non-single-crystal semiconductor laminate member Q_(i). In other embodiment of the photoelectric conversion device, the isolating portion H_(j) extends across the non-single-crystal semiconductor laminate member Q_(i).

Further, according to another embodiment of the photoelectric conversion device, the isolating portion H_(j) consists of the groove defined between the electrodes F_(j) and F_(j+1) and the oxide of the non-single-crystal semiconductor forming the non-single-crystal semiconductor laminate member Q_(j), which is formed in the upper half portion thereof.

Such isolating portions H₁ to H_(n) can easily be formed by carrying out in an oxygen atmosphere the irradiation of the laser beam for the conductive layer 43 described previously with respect to FIG. 4.

Moreover, according to another embodiment of the photoelectric conversion device the isolating portion H_(j) is formed by an oxide which results from oxidation of the conductive material forming the electrodes F_(j) and F_(j+1) and separates them. Such isolating portions H₁ to H_(n) can easily be formed by the irradiation of the same laser beam as that employed for abovesaid embodiment.

According to another embodiment of the photoelectric conversion device, the isolating portion H_(j) is formed by the groove which hardly extends into the non-single-crystal semiconductor laminate member Q_(j) but separates the electrodes E_(j) and E_(j+1) as shown. Such isolating portion H₁ to H_(n) can easily be formed by adjusting the power of the laser beam.

Further according to another embodiment of the photoelectric conversion device, the isolating portion H_(j) has such a structure that an oxide layer is formed on the interior surface of the groove described previously with respect to FIG. 3. Such an isolating portion H_(j) can easily be formed by performing the irradiation of the laser beam for the conductive layer 43 mentioned previously with regard to FIG. 4 in the oxygen atmosphere.

While in the foregoing embodiments of the present invention the groove O_(j) formed in the non-single-crystal semiconductor laminate members Q_(j) is shown to be a groove which continuously to completely isolate the non-single-crystal semiconductor laminate members Q_(j) and Q_(j+1) mechanically, the groove O_(j) may also be formed so that the non-single-crystal semiconductor laminate members Q_(j) and Q_(j+1) may not completely be isolated by the groove O_(j) from each other.

It will be apparent that may modifications and variations may be effected without departing from the scope of the novel concepts of the present invention. 

What is claimed is:
 1. A photoelectric conversion device comprising:a substrate having an insulating surface; and a plurality n of semiconductor photoelectric conversion elements U₁ to U_(n) sequentially formed side by side on the substrate and connected in series one after another; wherein the photoelectric conversion semiconductor elements U_(i) (i=1, 2, 3, . . . n) have a first electrode E_(i) formed on the substrate, a non-single-crystal semiconductor laminate member Q_(i) formed on the first electrode E_(i) and a second electrode F_(i) formed on the non-single-crystal semiconductor laminate member Q_(i), the non-single-crystal semiconductor laminate member Q_(i) having at least a first non-single-crystal semiconductor layer having a P or N conductivity type, a second non-single-crystal semiconductor layer of intrinsic type and a third non-single-crystal semiconductor layer having a same conductivity as the first non-single-crystal semiconductor layer; wherein the first electrodes E_(j) and E_(j+1) are separated by a first groove G_(j) ; wherein the non-single-crystal semiconductor laminate member Q_(j+1) has an extending portion Q'_(j+1) which extends to non-single-crystal laminate member Q_(j) and down to the substrate in the groove G_(j) ; wherein the second electrode F_(j+1) (j=1, 2 . . . (n-1)) extends on the extending portion Q'_(j+1) of the non-single-crystal semiconductor laminate member Q_(j+1) ; wherein the second electrodes F_(j) and F_(j+1) are separated by an isolating groove H_(j) opposite the first electrode E_(j) ; wherein the non-single-crystal semiconductor laminate member Q_(j) has a second groove O_(j) extending between the first electrode E_(j) and the second electrode F_(j+1) ; wherein the second electrode F_(j+1) is coupled with the first electrode E_(j) through a coupling portion K_(j) formed by an extension of the second electrode F_(j+1) and extending into the second groove O_(j) to couple with the first electrode E_(j) ; and wherein at least the second non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(j) has a semiconductor region between the first electrode E_(j) and the second electrode F_(j), the semiconductor region has a conductivity higher than the second non-single-crystal semiconductor layer of the extending portion Q'_(j) of the non-single-crystal semiconductor laminate member Q_(j) and the region of the second non-single-crystal semiconductor layer of the non-single-crystal semiconductor laminate member Q_(j) underlying the isolating groove H_(j).
 2. A photoelectric conversion device according to claim 1, wherein the substrate and the first electrodes E_(j) are transparent.
 3. A photoelectric conversion device according to claim 1, wherein the first semiconductor region being formed primarily of a first semi-amorphous semiconductor, and wherein the second non-single-crystal semiconductor layer of the extending portion Q'_(j+1) of the non-single-crystal semiconductor laminate member Q_(j+1) and the second semiconductor region being formed primarily of a second semiamorphous semiconductor containing more microcrystalline semiconductor than the first semi-amorphous semiconductor of the first semiconductor region.
 4. A semiconductor device according to claim 1, wherein the first semiconductor region being formed primarily of an amorphous semiconductor, and wherein the second non-single-crystal semiconductor layer of the extending portion Q'_(j+1) of the non-single-crystal semiconductor laminate member Q_(j+1) and the second semiconductor region being formed primarily of a semi-amorphous semiconductor.
 5. A semiconductor device according to claim 1, wherein the first semiconductor region being formed primarily of a mixture of a first semi-amorphous semiconductor and an amorphous semiconductor, and wherein the second non-single-crystal semiconductor layer of the extending portion Q'_(j+1) of the non-single-crystal semiconductor laminate member Q_(j+1) and the second semiconductor region being formed primarily of a second semi-amorphous semiconductor containing more the first semi-amorphous semiconductor of the first semiconductor region. 